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Influence of thermal coupling on lifetime under power cycling test / Yushan Zhao, Erping Deng, Maoyang Pan, Yiming Zhang, and Yongzhang Huang.

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TextPublication details: New York ; The Institute of Electrical and Electronics Engineers, Inc. , November 2022.Description: Volume 37, pages 13641-13651 : illustration ; 28 cmSubject(s):

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Item type	Current library	Collection	Call number	Status	Notes	Date due	Barcode
Periodicals	UM Digos College - LIC	Periodicals	DPer 621.317 Ie21 November 2022 v. 37 n. 11 (Browse shelf(Opens below))	Not for loan	Periodical Article

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IEEE Transactions on Power Electronics, vol. 37, no. 11, pages 13641-13651, November 2022.

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