Influence of thermal coupling on lifetime under power cycling test /
Zhao, Yushan.
Influence of thermal coupling on lifetime under power cycling test / Yushan Zhao, Erping Deng, Maoyang Pan, Yiming Zhang, and Yongzhang Huang. - New York ; The Institute of Electrical and Electronics Engineers, Inc. , November 2022. - Volume 37, pages 13641-13651 : illustration ; 28 cm.
IEEE Transactions on Power Electronics, vol. 37, no. 11, pages 13641-13651, November 2022.
Couplings.
Temperature distribution.
Insulated gate bipolar transistors.
DPer 621.317 Ie21 November 2022 v. 37 n. 11
Influence of thermal coupling on lifetime under power cycling test / Yushan Zhao, Erping Deng, Maoyang Pan, Yiming Zhang, and Yongzhang Huang. - New York ; The Institute of Electrical and Electronics Engineers, Inc. , November 2022. - Volume 37, pages 13641-13651 : illustration ; 28 cm.
IEEE Transactions on Power Electronics, vol. 37, no. 11, pages 13641-13651, November 2022.
Couplings.
Temperature distribution.
Insulated gate bipolar transistors.
DPer 621.317 Ie21 November 2022 v. 37 n. 11