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Impact of gate resistance on improving the dynamic overcurrent stress of the Si/SiC hybrid switch / Xiaofeng Jiang, Huaping Jiang, Xiaohan Zhong, Hua Mao, Zebing Wu, Lei Tang, Haoyu Chen, Jinpeng Cheng, and Li Ran.

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TextPublication details: New York ; The Institute of Electrical and Electronics Engineers, Inc. , November 2022.Description: Volume 37, pages 13319-13331 : illustration ; 28 cmSubject(s):

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Item type	Current library	Collection	Call number	Status	Notes	Date due	Barcode
Periodicals	UM Digos College - LIC	Periodicals	DPer 621.317 Ie21 November 2022 v. 37 n. 11 (Browse shelf(Opens below))	Not for loan	Periodical Article

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IEEE Transactions on Power Electronics, vol. 37, no. 11, pages 13319-13331, November 2022.

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