000 01090nam a22002417a 4500
005 20250327093353.0
008 250327b |||||||| |||| 00| 0 eng d
082 _aDPer 621.317 Ie21part 1&2 December 2022 v.37 n. 12.
100 _aWu, Yuwei.
_eauthor.
_955292
245 _aComparison and optimization of datasheet-driven extraction og gate-drain overlap oxide capacitance in igbt modeling /
_cYuwei Wu, Laili Wang, Jianpeng Wang, Zenan Shi, and Jin Zhang.
260 _aNew York ;
_bThe Institute of Electrical and Electronics Engineers, Inc.,
_cDecember 2022.
300 _avolume 37, pages 14023-14033,
_billustration.
500 _aIEEE Transactions on Power Electronics, v. 37 n. 12, pages 14023-14033, December 2022.
650 0 _aIGBT modeling.
_965957
650 0 _aIntegrated circuit modeling.
_965958
650 0 _aVoltage.
_965959
700 _aWu, Yuwei.
_eauthor.
_965952
700 _aWang, Laili.
_eauthor.
_965953
700 _aWang, Jianpeng.
_eauthor.
_965954
700 _aShi, Zenan.
_eauthor.
_965955
700 _aZhang, Jin.
_eauthor.
_965956
942 _2ddc
_cPER
999 _c23598
_d23598