000 01290nam a22003017a 4500
003 OSt
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008 240906b ||||| |||| 00| 0 eng d
040 _c0
082 _aDPer 621.317 Ie21 December 2022 v.37 n. 12 part 1&2.
100 _aFan, Jiayu.
_eauthor.
_960377
245 _aComparisons of two turn-off failures under clamped inductive load in planar fs 3.3 kv/50 a igbt chip /
_cJiayu Fan, Yaohua Wang, Feng He, Mingchao Gao, Zhibin Zhao, Xuebao Li, Xiang Cui, and Zhong Chen.
260 _aNew York ;
_bThe Institute of Electrical and Electronics Engineers, Inc.,
_cDecember 2022.
300 _avolume 37, pages 14471-14481,
_billustration.
500 _aIEEE Transactions on Power Electronics, v. 37 n. 12, pages 14471-14481, December 2022.
650 0 _aDistinguished method.
_966071
650 0 _adynamic latch-up.
_966072
650 0 _asecondary breakdown.
_966073
700 _aFan, Jiayu.
_eauthor.
_960377
700 _aWang, Yaohua.
_eauthor.
_960378
700 _aHe, Feng.
_eauthor.
_960379
700 _aGao, Mingchao.
_eauthor.
_960380
700 _aZhao, Zhibin.
_eauthor.
_960381
700 _aLi, Xuebao.
_eauthor.
_960382
700 _aCui, Xiang.
_eauthor.
_960383
700 _aChen, Zhong.
_eauthor.
_960384
942 _2ddc
_cPER
999 _c21396
_d21396