000			01123nam a22002657a 4500
003			OSt
005			20250904151126.0
008			240426b ||||| |||| 00| 0 eng d
040			_c0
082			_aDPer 621.317 Ie21 November 2022 v. 37 n. 11
100			_aZhao, Yushan. _eauthor. _956728
245			_aInfluence of thermal coupling on lifetime under power cycling test / _cYushan Zhao, Erping Deng, Maoyang Pan, Yiming Zhang, and Yongzhang Huang.
260			_aNew York ; _bThe Institute of Electrical and Electronics Engineers, Inc. , _cNovember 2022.
300			_aVolume 37, pages 13641-13651 : _billustration ; _c28 cm.
500			_aIEEE Transactions on Power Electronics, vol. 37, no. 11, pages 13641-13651, November 2022.
650		0	_aCouplings. _965917
650		0	_aTemperature distribution. _967230
650		0	_aInsulated gate bipolar transistors. _967231
700			_aZhao, Yushan. _eauthor. _956728
700			_aDeng, Erping. _eauthor. _956729
700			_aPan, Maoyang. _eauthor. _956730
700			_aZhang, Yiming. _eauthor. _956731
700			_aHuang, Yongzhang. _eauthor. _956732
942			_2ddc _cPER
999			_c20168 _d20168