| 000 | 00837nam a22001937a 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20251002180550.0 | ||
| 008 | 240403b ||||| |||| 00| 0 eng d | ||
| 040 | _c0 | ||
| 082 | _aDPer 621.317 Ie21 October 2022 v. 37 n. 10 | ||
| 100 |
_aRoy, Shamibrota Kishore. _eauthor. _955973 |
||
| 245 |
_aMeasurement of circuit parasitics of SiC MOSFET in a half-bridge configuration / _cShamibrota Kishore Roy and Kaushik Basu. |
||
| 260 |
_aNew York ; _bThe Institute of Electrical and Electronics Engineers, Inc. , _cOctober 2022. |
||
| 300 |
_aVolume 37, pages 11911-11926 : _billustration ; _c28 cm. |
||
| 500 | _aIEEE Transactions on Power Electronics, v. 37, n. 10, pages 11911-11926, October 2022. | ||
| 700 |
_aRoy, Shamibrota Kishore. _eauthor. _955973 |
||
| 700 |
_aBasu, Kaushik. _eauthor. _955974 |
||
| 942 |
_2ddc _cPER |
||
| 999 |
_c19994 _d19994 |
||