000 01067nam a22002297a 4500
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040 _c0
082 _aDPer 621.317 Ie21 October 2022 v. 37 n. 10
100 _aScognamillo, Ciro.
_eauthor.
_955801
245 _aA technique for the In-Situ experimental extraction of the thermal impedance of power devices /
_cCiro Scognamillo, Sebastien Fregonese, Thomas Zimmer, Vincenzo d'Alessandro, and Antonio Pio Catalano.
260 _aNew York ;
_bThe Institute of Electrical and Electronics Engineers, Inc. ,
_cOctober 2022.
300 _avolume 37, pages 11511-11515 :
_billustration ;
_c28 cm.
500 _aIEEE Transactions on Power Electronics, v. 37, n. 10, pages 11511-11515, October 2022.
700 _aScognamillo, Ciro.
_eauthor.
_955801
700 _aFregonese, Sebastien.
_eauthor.
_955802
700 _aZimmer, Thomas.
_eauthor.
_955803
700 _ad'Alessandro, Vincenzo.
_eauthor.
_955804
700 _aCatalano, Antonio Pio.
_eauthor.
_955805
942 _2ddc
_cPER
999 _c19957
_d19957