000 01224nam a22002657a 4500
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040 _c0
082 _aDPer 621.317 Ie21 July 2022 v.37 n. 7
100 _aZhou, Wenpeng.
_eauthor.
_954207
245 _aSystematic analysis and characterization of extreme failure for IGCT in MMC-HVdc system—part I:
_bdevice structure, explosion characteristics, and optimization /
_cWenpeng Zhou, Biao Zhao, Jiapeng Liu, Zhengyu Chen, Xueteng Tang, Zhanqing Yu, Jinpeng Wu, and Rong Zeng
260 _aNew York ;
_bThe Institute of Electrical and Electronics Engineers, Inc. ,
_cJuly 2022.
300 _avolume 37, pages 8076-8086 :
_billustration ;
_c28 cm.
500 _a IEEE Transactions on Power Electronics, vol. 37, no. 7, pages 8076-8086 , July 2022.
700 _aZhou, Wenpeng.
_eauthor.
_954207
700 _aZhao, Biao.
_eauthor.
_954208
700 _aLiu, Jiapeng.
_eauthor.
_954209
700 _aChen, Zhengyu.
_eauthor.
_954210
700 _aTang, Xueteng.
_eauthor.
_954211
700 _aYu, Zhanqing.
_eauthor.
_954212
700 _aWu, Jinpeng.
_eauthor.
_954213
700 _aZeng, Rong.
_eauthor.
_954214
942 _2ddc
_cPER
999 _c19569
_d19569