| 000 | 01051nam a22002537a 4500 | ||
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| 003 | OSt | ||
| 005 | 20250916095549.0 | ||
| 008 | 240228b ||||| |||| 00| 0 eng d | ||
| 040 | _c0 | ||
| 082 | _aDPer 621.317 Ie21 June 2022 v. 37 n. 6 | ||
| 100 |
_aSun, Ruize. _eauthor. _953608 |
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| 245 |
_aAnalysis of energy loss in GaN e-mode devices under UIS stresses / _cRuize Sun, Jingxue Lai, Chao Liu, Wanjun Chen, Yiqiang Chen, Zhaoji Li, and Bo Zhang. |
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| 260 |
_aNew York ; _bThe Institute of Electrical and Electronics Engineers, Inc. , _cJune 2022. |
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| 300 |
_aVolume 37, pages 6711-6719 : _billustration ; _c29 cm. |
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| 500 | _aIEEE Transactions on Power Electronics, vol. 37, no. 6, pages 6711-6719, June 2022. | ||
| 700 |
_aSun, Ruize. _eauthor. _953608 |
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| 700 |
_aLai, Jingxue. _eauthor. _953609 |
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| 700 |
_aLiu, Chao. _eauthor. _953610 |
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| 700 |
_aChen, Wanjun. _eauthor. _953611 |
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| 700 |
_aChen, Yiqiang. _eauthor. _953612 |
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| 700 |
_aLi, Zhaoji. _eauthor. _953613 |
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| 700 |
_aZhang, Bo. _eauthor. _953614 |
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| 942 |
_2ddc _cPER |
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| 999 |
_c19421 _d19421 |
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