| 000 | 01103nam a22002537a 4500 | ||
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| 003 | OSt | ||
| 005 | 20250910091412.0 | ||
| 008 | 240226b ||||| |||| 00| 0 eng d | ||
| 040 | _c0 | ||
| 082 | _aDPer 621.317 Ie21 June 2022 v. 37 n. 6 | ||
| 100 |
_aZhang, Ruizhe. _eauthor. _953321 |
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| 245 |
_aBreakthrough short circuit robustness demonstrated in vertical GaN Fin JFET / _cRuizhe Zhang, Jingcun Liu, Qiang Li, Subhash Pidaparthi, Andrew Edwards, Cliff Drowley, and Yuhao Zhang. |
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| 260 |
_aNew York ; _bThe Institute of Electrical and Electronics Engineers, Inc. , _cJune 2022. |
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| 300 |
_aVolume 37, pages 6253-6258 : _billustration ; _c29 cm. |
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| 500 | _aIEEE Transactions on Power Electronics, vol. 37, no. 6, pages 6253-6258, June 2022. | ||
| 700 |
_aZhang, Ruizhe. _eauthor. _953321 |
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| 700 |
_aLiu, Jingcun. _eauthor. _953322 |
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| 700 |
_aLi, Qiang. _eauthor. _953323 |
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| 700 |
_aPidaparthi, Subhash. _eauthor. _953324 |
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| 700 |
_aEdwards, Andrew. _eauthor. _953325 |
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| 700 |
_aDrowley, Cliff. _eauthor. _953326 |
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| 700 |
_aZhang, Yuhao. _eauthor. _953327 |
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| 942 |
_2ddc _cPER |
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| 999 |
_c19354 _d19354 |
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