| 000 | 01117nam a22002537a 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20250911170007.0 | ||
| 008 | 240222b ||||| |||| 00| 0 eng d | ||
| 040 | _c0 | ||
| 082 | _aDPer 621.317 Ie21 May 2022 v. 37 n. 5 | ||
| 100 |
_aJiang, Zuoheng. _eauthor. _953132 |
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| 245 |
_aNegative gate bias induced dynamic ON-resistance degradation in schottky-type p-gan gate HEMTs / _cZuoheng Jiang, Mengyuan Hua, Xinran Huang, Lingling Li, Chengcai Wang, Junting Chen, and Kevin J. Chen. |
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| 260 |
_aNew York ; _bThe Institute of Electrical and Electronics Engineers, Inc. , _cMay 2022. |
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| 300 |
_aVolume 37, pages 6018-6025 : _billustration ; _c28 cm. |
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| 500 | _aIEEE Transactions on Power Electronics, vol. 37, no. 5, pages 6018-6025, May 2022. | ||
| 700 |
_aJiang, Zuoheng. _eauthor. _953132 |
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| 700 |
_aHua, Mengyuan. _eauthor. _953133 |
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| 700 |
_aHuang, Xinran. _eauthor. _953134 |
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| 700 |
_aLi, Lingling. _eauthor. _953135 |
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| 700 |
_aWang, Chengcai. _eauthor. _953136 |
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| 700 |
_aChen, Junting. _eauthor. _953137 |
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| 700 |
_aChen, Kevin J. _eauthor. _953138 |
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| 942 |
_2ddc _cPER |
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| 999 |
_c19310 _d19310 |
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