| 000 | 01263nam a22002897a 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20250911165944.0 | ||
| 008 | 240222b ||||| |||| 00| 0 eng d | ||
| 040 | _c0 | ||
| 082 | _aDPer 621.317 Ie21 May 2022 v. 37 n. 5 | ||
| 100 |
_aZhang, Chi. _eauthor. _953122 |
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| 245 |
_aInvestigation on the degradation mechanism for GaN cascode device under repetitive hard-switching stress / _cChi Zhang, Siyang Liu, Sheng Li, Yanfeng Ma, Weihao Lu, Jingwen Huang, Weifeng Sun, Zhuo Yang, Yuanzheng Zhu, and Lihua Ni. |
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| 260 |
_aNew York ; _bThe Institute of Electrical and Electronics Engineers, Inc. , _cMay 2022. |
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| 300 |
_aVolume 37, pages 6009-6017 : _billustration ; _c28 cm. |
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| 500 | _aIEEE Transactions on Power Electronics, vol. 37, no. 5, pages 6009-6017, May 2022. | ||
| 700 |
_aZhang, Chi. _eauthor. _953122 |
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| 700 |
_aLiu, Siyang. _eauthor. _953123 |
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| 700 |
_aLi, Sheng. _eauthor. _953124 |
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| 700 |
_aMa, Yanfeng. _eauthor. _953125 |
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| 700 |
_aLu, Weihao. _eauthor. _953126 |
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| 700 |
_aHuang, Jingwen. _eauthor. _953127 |
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| 700 |
_aSun, Weifeng. _eauthor. _953128 |
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| 700 |
_aYang, Zhuo. _eauthor. _953129 |
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| 700 |
_aZhu, Yuanzheng. _eauthor. _953130 |
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| 700 |
_aNi, Lihua. _eauthor. _953131 |
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| 942 |
_2ddc _cPER |
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| 999 |
_c19309 _d19309 |
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