| 000 | 00998nam a22002177a 4500 | ||
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| 003 | OSt | ||
| 005 | 20250911163955.0 | ||
| 008 | 240222b ||||| |||| 00| 0 eng d | ||
| 040 | _c0 | ||
| 082 | _aDPer 621.317 Ie21 May 2022 v. 37 n. 5 | ||
| 100 |
_aNayak, Debi Prasad. _eauthor. _952958 |
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| 245 |
_aTemperature-dependent reverse recovery characterization of SiC MOSFETs body diode for switching loss estimation in a half-bridge / _cDebi Prasad Nayak, Ravi Kumar Yakala, Manish Kumar, and Sumit Kumar Pramanick. |
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| 260 |
_aNew York ; _bThe Institute of Electrical and Electronics Engineers, Inc. , _cMay 2022. |
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| 300 |
_aVolume 37, pages 5574-5582 : _billustration ; _c28 cm. |
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| 500 | _aIEEE Transactions on Power Electronics, vol. 37, no. 5, pages 5574-5582, May 2022. | ||
| 700 |
_aNayak, Debi Prasad. _eauthor. _952958 |
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| 700 |
_aYakala, Ravi Kumar. _eauthor. _952959 |
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| 700 |
_aKumar, Manish. _952960 |
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| 700 |
_aPramanick, Sumit Kumar. _eauthor. _952961 |
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| 942 |
_2ddc _cPER |
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| 999 |
_c19273 _d19273 |
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