000 01379nam a22003017a 4500
003 OSt
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008 240222b ||||| |||| 00| 0 eng d
040 _c0
082 _aDPer 621.317 Ie21 May 2022 v. 37 n. 5
100 _aZhou, Wenpeng.
_eauthor.
_952947
245 _aSystematic analysis and characterization of extreme failure for IGCT in MMC-HVdc system-part II: /
_bfailure mechanism and short circuit characteristics /
_cWenpeng Zhou, Zhanqing Yu, Zhengyu Chen, Fanglin Chen, Xueteng Tang, Zaixuan Shang, Haoyu Ma, Jun Hu, Biao Zhao, Jinpeng Wu, and Rong Zeng.
260 _aNew York ;
_bThe Institute of Electrical and Electronics Engineers, Inc. ,
_cMay 2022.
300 _aVolume 37, pages 5562-5573 :
_billustration ;
_c28 cm.
500 _aIEEE Transactions on Power Electronics, vol. 37, no. 7, pages 5562-5573, July 2022.
700 _aZhou, Wenpeng.
_eauthor.
_952947
700 _aYu, Zhanqing.
_eauthor.
_952948
700 _aChen, Zhengyu.
_eauthor.
_952949
700 _aChen, Fanglin.
_eauthor.
_952950
700 _aTang, Xueteng.
_eauthor.
_952951
700 _aShang, Zaixuan.
_eauthor.
_952952
700 _aMa, Haoyu.
_eauthor.
_952953
700 _aHu, Jun.
_eauthor.
_952954
700 _aZhao, Biao.
_eauthor.
_952955
700 _aWu, Jinpeng.
_eauthor.
_952956
700 _aZeng, Rong.
_eauthor.
_952957
942 _2ddc
_cPER
999 _c19272
_d19272