| 000 | 01026nam a22002177a 4500 | ||
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| 005 | 20250912181025.0 | ||
| 008 | 240213b ||||| |||| 00| 0 eng d | ||
| 082 | _aDPer 621.381 In821 April 2022 v. 37 n. 4 | ||
| 100 |
_aVankayalapati, Bhanu Teja. _952185 |
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| 245 |
_aInvestigation and on-board detection of gate-open failure in SiC MOSFETs / _cBhanu Teja Vankayalapati, Shi Pu, Fei Yang, Masoud Farhadi, Vigneshwaran Gurusamy, and Bilal Akin. |
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| 260 |
_aNew York ; _bThe Institute of Electrical and Electronics Engineers, Inc. , _cApril 2022. |
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| 300 |
_aVolume 37, pages 4658-4671 : _billustration ; _c28 cm. |
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| 521 | _aIEEE Transaction on Power Electronics, vol. 37, no. 4, pages 4658-4671, April 2022. | ||
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_aVankayalapati, Bhanu Teja. _eauthor. _952185 |
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| 700 |
_aPu, Shi. _eauthor. _952186 |
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| 700 |
_aYang, Fei. _eauthor. _952187 |
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| 700 |
_aFarhadi, Masoud. _eauthor. _952188 |
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| 700 |
_aGurusamy, Vigneshwaran. _eauthor. _952189 |
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| 700 |
_aAkin, Bilal. _eauthor. _952190 |
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| 942 |
_2ddc _cPER |
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| 999 |
_c19097 _d19097 |
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