000 01071nam a22002417a 4500
003 OSt
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040 _c0
082 _aDPer 621.381 In821 April 2022 v. 37 n. 4
100 _aFeng, Yuxin.
_eauthor.
_951515
245 _aShort-circuit and over-current fault detection for SiC MOSFET modules based on tunnel magnetoresistance with predictive capabilities /
_cYuxin Feng, Shuai Shao, Jiakun Du, Qian Chen, Junming Zhang, and Xinke Wu.
260 _aNew York ;
_bThe Institute of Electrical and Electronics Engineers, Inc. ,
_cApril 2022.
300 _aVolume 37, pages 3719-3723 :
_b illustration ;
_c28 cm.
500 _aIEEE Transactions on Power Electronics, vol. 37, no. 4, pages 3719-3723, April 2022.
700 _aFeng, Yuxin.
_eauthor.
_951515
700 _aShao, Shuai.
_eauthor.
_951516
700 _aDu, Jiakun.
_eauthor.
_951517
700 _aChen, Qian.
_eauthor.
_951518
700 _aZhang, Junming.
_eauthor.
_951519
700 _aWu, Xinke.
_eauthor.
_951520
942 _2ddc
_cPER
999 _c18936
_d18936