A robust testing method for DC and AC capacitors with minimum required power supply / Bo Yao, Qian Wang, Haoran Wang, Kazunori Hasegawa, and Huai Wang.
Material type:
TextPublication details: New York ; The Institute of Electrical and Electronics Engineers, Inc., May 2022.Description: Volume 37, pages 4942-4946 : illustration ; 28 cmSubject(s): DDC classification: - DPer 621.317 Ie21 May 2022 v. 37 n. 5
| Item type | Current library | Collection | Call number | Status | Notes | Date due | Barcode | |
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Periodicals
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UM Digos College - LIC | Periodicals | DPer 621.317 Ie21 May 2022 v. 37 n. 5 (Browse shelf(Opens below)) | Not for loan | Periodical Article |
IEEE Transactions on Power Electronics, v. 37 n. 5, pages 4942-4946, May 2022.
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