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Rethinking basic assumptions for modeling parasitic capacitance in inductors / Hongbo Zhao, Shaokang Luan, Zhan Shen, Alex J. Hanson, Yuan Gao, Dipen Narendra Dalal, Rui Wang, Shuhan Zhou, and Stig Munk-Nielsen by
- Zhao, Hongbo [author.]
- Zhao, Hongbo [author.]
- Luan, Shaokang [author.]
- Shen, Zhan [author.]
- Hanson, Alex J [author.]
- Gao, Yuan [author.]
- Dalal, Dipen Narendra [author.]
- Wang, Rui [author.]
- Zhou, Shuhan [author.]
- Munk-Nielsen, Stig [author.]
Material type: Text; Format:
print
; Literary form:
Not fiction
Publication details: New York ; The Institute of Electrical and Electronics Engineers, Inc. , July 2022
Availability: Items available for reference: UM Digos College - LIC: Not for loan (1)Call number: DPer 621.317 Ie21 July 2022 v.37 n. 7.
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