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Systematic analysis and characterization of extreme failure for IGCT in MMC-HVdc system—part I: device structure, explosion characteristics, and optimization / Wenpeng Zhou, Biao Zhao, Jiapeng Liu, Zhengyu Chen, Xueteng Tang, Zhanqing Yu, Jinpeng Wu, and Rong Zeng by
Material type: Text; Format:
print
; Literary form:
Not fiction
Publication details: New York ; The Institute of Electrical and Electronics Engineers, Inc. , July 2022
Availability: Items available for reference: UM Digos College - LIC: Not for loan (1)Call number: DPer 621.317 Ie21 July 2022 v.37 n. 7.
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