Wu, Yuwei. <br/><br/>
Comparison and optimization of datasheet-driven extraction og gate-drain overlap oxide capacitance in igbt modeling / 
Yuwei Wu, Laili Wang, Jianpeng Wang, Zenan Shi, and Jin Zhang. 
 - New York ;   The Institute of Electrical and Electronics Engineers, Inc.,   December 2022. 
 - volume 37, pages 14023-14033,  illustration. 
<br/><br/> IEEE Transactions on Power Electronics, v. 37 n. 12, pages 14023-14033, December 2022.  
<br/><br/><label>Subjects--Topical Terms: </label><br/>IGBT modeling.<br/>Integrated circuit modeling.<br/>Voltage.
<br/><br/><label>Dewey Class. No.: </label>DPer 621.317 Ie21part 1&2 December 2022 v.37 n. 12.