A seasonal-trend-decomposition-based voltage-source-inverter open-circuit fault diagnosis method - Zhou, Yang.; Zhou, Yang.; Zhao, Jin.; Song, Yujin; Sun, Jiajiang; Fu, Hu.; Chu, Min. (New York ; The Institute of Electrical and Electronics Engineers, Inc., 2022)
IEEE Transactions on Power Electronics, v. 37 n. 12, pages 15517-15527, December 2022.
Keywords: Circuit faults; Power transistors; voltage-source inverter (VSI).