Fan, Jiayu. <br/><br/>
Comparisons of two turn-off failures under clamped inductive load in planar fs 3.3 kv/50 a igbt chip / 
Jiayu Fan, Yaohua Wang, Feng He, Mingchao Gao, Zhibin Zhao, Xuebao Li, Xiang Cui, and Zhong Chen. 
 - New York ;   The Institute of Electrical and Electronics Engineers, Inc.,   December 2022. 
 - volume 37, pages 14471-14481,  illustration. 
<br/><br/> IEEE Transactions on Power Electronics, v. 37 n. 12, pages 14471-14481, December 2022.  
<br/><br/><label>Subjects--Topical Terms: </label><br/>Distinguished method.<br/>dynamic latch-up.<br/>secondary breakdown.
<br/><br/><label>Dewey Class. No.: </label>DPer 621.317 Ie21 December 2022 v.37 n. 12 part 1&2.