TY  - BOOK
AU  - Zhao, Yushan.
AU  - Zhao, Yushan.
AU  - Deng, Erping.
AU  - Pan, Maoyang.
AU  - Zhang, Yiming.
AU  - Huang, Yongzhang.
TI  - Influence of thermal coupling on lifetime under power cycling test
U1  - DPer 621.317 Ie21 November 2022 v. 37 n. 11 
PY  - 2022///
CY  - New York
PB  - The Institute of Electrical and Electronics Engineers, Inc.
KW  - Couplings
KW  - Temperature distribution
KW  - Insulated gate bipolar transistors
N1  - IEEE Transactions on Power Electronics, vol. 37, no. 11, pages 13641-13651, November 2022
ER  -