Zhao, Yushan. <br/><br/>
Influence of thermal coupling on lifetime under power cycling test / 
Yushan Zhao, Erping Deng, Maoyang Pan, Yiming Zhang, and Yongzhang Huang. 
 - New York ;  The Institute of Electrical and Electronics Engineers, Inc. ,  November 2022. 
 - Volume 37, pages 13641-13651 :  illustration ;  28 cm. 
<br/><br/> IEEE Transactions on Power Electronics, vol. 37, no. 11, pages 13641-13651, November 2022. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Couplings.<br/>Temperature distribution.<br/>Insulated gate bipolar transistors.
<br/><br/><label>Dewey Class. No.: </label>DPer 621.317 Ie21 November 2022 v. 37 n. 11