TY  - BOOK
AU  - Wang, Rui.
AU  - Wang, Rui.
AU  - Jorgensen, Asger Bjorn.
AU  - Zhao, Hongbo.
AU  - Munk-Nielsen, Stig.
TI  - Short-circuit characteristic of single gate driven SiC MOSFET stack and its improvement with strong antishort circuit fault capabilities / 
U1  - DPer 621.317 Ie21 November 2022 v. 37 n. 11 
PY  - 2022///
CY  - New York
PB  - The Institute of Electrical and Electronics Engineers, Inc.
KW  -  Circuit faults
KW  - MOSFET
KW  - Threshold voltage
N1  - IEEE Transactions on Power Electronics, vol. 37, no. 11, pages 13554-13565, November 2022
ER  -