Short-circuit characteristic of single gate driven SiC MOSFET stack and its improvement with strong antishort circuit fault capabilities - Wang, Rui.; Wang, Rui.; Jorgensen, Asger Bjorn; Zhao, Hongbo; Munk-Nielsen, Stig. (New York ; The Institute of Electrical and Electronics Engineers, Inc., 2022)
IEEE Transactions on Power Electronics, vol. 37, no. 11, pages 13554-13565, November 2022.
Keywords: Circuit faults; MOSFET; Threshold voltage