TY  - BOOK
AU  - Jiang, Xiaofeng.
AU  - Jiang, Xiaofeng.
AU  - Jiang, Huaping.
AU  - Zhong, Xiaohan.
AU  - Mao, Hua.
AU  - Wu, Zebing.
AU  - Tang, Lei.
AU  - Chen, Haoyu.
AU  - Cheng, Jinpeng.
AU  - Ran, Li.
TI  - Impact of gate resistance on improving the dynamic overcurrent stress of the Si/SiC hybrid switch / 
U1  - DPer 621.317 Ie21 November 2022 v. 37 n. 11 
PY  - 2022///
CY  - New York ; 
PB  - The Institute of Electrical and Electronics Engineers, Inc.
KW  - Dynamic overcurrent stress
KW  - Silicon carbide (SiC)
KW  - Silicon carbide metal oxide semiconductor field effect transistor (SiC MOSFET)
N1  - IEEE Transactions on Power Electronics, vol. 37, no. 11, pages 13319-13331, November 2022
ER  -