Roy, Shamibrota Kishore. <br/><br/>
Measurement of circuit parasitics of SiC MOSFET in a half-bridge configuration / 
Shamibrota Kishore Roy and Kaushik Basu. 
 - New York ;   The Institute of Electrical and Electronics Engineers, Inc. ,   October 2022. 
 - Volume 37, pages 11911-11926 :   illustration ;  28 cm. 
<br/><br/> IEEE Transactions on Power Electronics, v. 37, n. 10, pages 11911-11926, October 2022. 
<br/><br/><label>Dewey Class. No.: </label>DPer 621.317 Ie21 October 2022 v. 37 n. 10