TY  - BOOK
AU  - Jiang, Huaping.
AU  - Jiang, Huaping.
AU  - Qi, Xiaowei.
AU  - Qiu, Guanqun.
AU  - Zhong, Xiaohan.
AU  - Tang, Lei.
AU  - Mao, Hua.
AU  - Wu, Zebing.
AU  - Chen, Honggang.
AU  - Ran, Li.
TI  - A physical explanation of threshold voltage drift of SiC MOSFET induced by gate switching
U1  - DPer 621.381 In821 August 2022 v. 37 n. 8 
PY  - 2022///
CY  - New York ; 
PB  - The Institute of Electrical and Electronics Engineers, Inc. , 
N1  - IEEE Transitions on Power Electronics, v. 37 n. 8, pages 8830-8834, August 2022
ER  -