Zhou, Wenpeng. <br/><br/>
Systematic analysis and characterization of extreme failure for IGCT in MMC-HVdc system—part I:  device structure, explosion characteristics, and optimization / 
Wenpeng Zhou, Biao Zhao, Jiapeng Liu, Zhengyu Chen, Xueteng Tang, Zhanqing Yu, Jinpeng Wu, and Rong Zeng 
 - New York ;  The Institute of Electrical and Electronics Engineers, Inc. ,  July 2022. 
 - volume 37, pages 8076-8086 :  illustration ;  28 cm. 
<br/><br/> <br/>IEEE Transactions on Power Electronics, vol. 37, no. 7, pages 8076-8086 , July 2022.<br/> 
<br/><br/><label>Dewey Class. No.: </label>DPer 621.317 Ie21 July 2022 v.37 n. 7