TY  - BOOK
AU  - Xie, Minghang.
AU  - Xie, Minghang.
AU  - Sun, Pengju.
AU  - Wang, Kaihong.
AU  - Luo, Quanming.
AU  - Du, Xiong.
TI  - Online gate-oxide degradation monitoring of planar SiC MOSFETs based on gate charge time
U1  - DPer 621.317 Ie21 June 2022 v. 37 n. 6 
PY  - 2022///
CY  - New York ; 
PB  - The Institute of Electrical and Electronics Engineers, Inc. , 
N1  - IEEE Transactions on Power Electronics, vol. 37, no. 6, pages 7333-7343, June 2022
ER  -