Xie, Minghang. <br/><br/>
Online gate-oxide degradation monitoring of planar SiC MOSFETs based on gate charge time / 
Minghang Xie, Pengju Sun, Kaihong Wang, Quanming Luo, and Xiong Du. 
 - New York ;   The Institute of Electrical and Electronics Engineers, Inc. ,   June 2022. 
 - Volume 37, pages 7333-7343 :  illustration ;  29 cm. 
<br/><br/> IEEE Transactions on Power Electronics, vol. 37, no. 6, pages 7333-7343, June 2022. 
<br/><br/><label>Dewey Class. No.: </label>DPer 621.317 Ie21 June 2022 v. 37 n. 6