Sun, Ruize. <br/><br/>
Analysis of energy loss in GaN e-mode devices under UIS stresses / 
Ruize Sun, Jingxue Lai, Chao Liu, Wanjun Chen, Yiqiang Chen, Zhaoji Li, and Bo Zhang. 
 - New York ;   The Institute of Electrical and Electronics Engineers, Inc. ,   June 2022. 
 - Volume 37, pages 6711-6719 :  illustration ;  29 cm. 
<br/><br/> IEEE Transactions on Power Electronics, vol. 37, no. 6, pages 6711-6719, June 2022. 
<br/><br/><label>Dewey Class. No.: </label>DPer 621.317 Ie21 June 2022 v. 37 n. 6