TY  - BOOK
AU  - Lu, Shengchang.
AU  - Lu, Shengchang.
AU  - Zhang, Zichen.
AU  - Buttay, Cyril.
AU  - Ngo, Khai D. T. 
AU  - Lu, Guo-Quan.
TI  - Improved measurement accuracy for junction-to-case thermal resistance of Gan HEMT packages by gate-to-gate electrical interface materials
U1  - DPer 621.317 Ie21 June 2022 v. 37 n. 6 
PY  - 2022///
CY  - New York ; 
PB  - The Institute of Electrical and Electronics Engineers, Inc. , 
N1  - IEEE Transactions on Power Electronics, vol. 37, no. 6, pages 6285-6289, June 2022
ER  -