TY  - BOOK
AU  - Zhang, Ruizhe.
AU  - Zhang, Ruizhe.
AU  - Liu, Jingcun.
AU  - Li, Qiang.
AU  - Pidaparthi, Subhash.
AU  - Edwards, Andrew.
AU  - Drowley, Cliff.
AU  - Zhang, Yuhao.
TI  - Breakthrough short circuit robustness demonstrated in vertical GaN Fin JFET
U1  - DPer 621.317 Ie21 June 2022 v. 37 n. 6 
PY  - 2022///
CY  - New York ; 
PB  - The Institute of Electrical and Electronics Engineers, Inc. , 
N1  - IEEE Transactions on Power Electronics, vol. 37, no. 6, pages 6253-6258, June 2022
ER  -