Zhang, Ruizhe. <br/><br/>
Breakthrough short circuit robustness demonstrated in vertical GaN Fin JFET / 
Ruizhe Zhang, Jingcun Liu, Qiang Li, Subhash Pidaparthi, Andrew Edwards, Cliff Drowley, and Yuhao Zhang. 
 - New York ;   The Institute of Electrical and Electronics Engineers, Inc. ,   June 2022. 
 - Volume 37, pages 6253-6258 :  illustration ;  29 cm. 
<br/><br/> IEEE Transactions on Power Electronics, vol. 37, no. 6, pages 6253-6258, June 2022. 
<br/><br/><label>Dewey Class. No.: </label>DPer 621.317 Ie21 June 2022 v. 37 n. 6