TY  - BOOK
AU  - Jiang, Zuoheng.
AU  - Jiang, Zuoheng.
AU  - Hua, Mengyuan.
AU  - Huang, Xinran.
AU  - Li, Lingling.
AU  - Wang, Chengcai.
AU  - Chen, Junting.
AU  - Chen, Kevin J.
TI  - Negative gate bias induced dynamic ON-resistance degradation in schottky-type p-gan gate HEMTs
U1  - DPer 621.317 Ie21 May 2022 v. 37 n. 5 
PY  - 2022///
CY  - New York ; 
PB  - The Institute of Electrical and Electronics Engineers, Inc. , 
N1  - IEEE Transactions on Power Electronics, vol. 37, no. 5, pages 6018-6025, May 2022
ER  -