TY  - BOOK
AU  - Zhang, Chi.
AU  - Zhang, Chi.
AU  - Liu, Siyang.
AU  - Li, Sheng.
AU  - Ma, Yanfeng.
AU  - Lu, Weihao.
AU  - Huang, Jingwen.
AU  - Sun, Weifeng.
AU  - Yang, Zhuo.
AU  - Zhu, Yuanzheng.
AU  - Ni, Lihua.
TI  - Investigation on the degradation mechanism for GaN cascode device under repetitive hard-switching stress
U1  - DPer 621.317 Ie21 May 2022 v. 37 n. 5 
PY  - 2022///
CY  - New York ; 
PB  - The Institute of Electrical and Electronics Engineers, Inc. , 
N1  - IEEE Transactions on Power Electronics, vol. 37, no. 5, pages 6009-6017, May 2022
ER  -