Investigation on the degradation mechanism for GaN cascode device under repetitive hard-switching stress - Zhang, Chi.; Zhang, Chi.; Liu, Siyang; Li, Sheng; Ma, Yanfeng; Lu, Weihao; Huang, Jingwen; Sun, Weifeng; Yang, Zhuo.; Zhu, Yuanzheng; Ni, Lihua (New York ; The Institute of Electrical and Electronics Engineers, Inc., 2022)
IEEE Transactions on Power Electronics, vol. 37, no. 5, pages 6009-6017, May 2022.