Zhang, Chi. <br/><br/>
Investigation on the degradation mechanism for GaN cascode device under repetitive hard-switching stress / 
Chi Zhang, Siyang Liu, Sheng Li, Yanfeng Ma, Weihao Lu, Jingwen Huang, Weifeng Sun, Zhuo Yang, Yuanzheng Zhu, and Lihua Ni. 
 - New York ;   The Institute of Electrical and Electronics Engineers, Inc. ,   May 2022. 
 - Volume 37, pages 6009-6017 :  illustration ;  28 cm. 
<br/><br/> IEEE Transactions on Power Electronics, vol. 37, no. 5, pages 6009-6017, May 2022. 
<br/><br/><label>Dewey Class. No.: </label>DPer 621.317 Ie21 May 2022 v. 37 n. 5