Temperature-dependent reverse recovery characterization of SiC MOSFETs body diode for switching loss estimation in a half-bridge - Nayak, Debi Prasad; Nayak, Debi Prasad; Yakala, Ravi Kumar; Kumar, Manish; Pramanick, Sumit Kumar (New York ; The Institute of Electrical and Electronics Engineers, Inc., 2022)
IEEE Transactions on Power Electronics, vol. 37, no. 5, pages 5574-5582, May 2022.