Nayak, Debi Prasad. <br/><br/>
Temperature-dependent reverse recovery characterization of SiC MOSFETs body diode for switching loss estimation in a half-bridge / 
Debi Prasad Nayak, Ravi Kumar Yakala, Manish Kumar, and Sumit Kumar Pramanick. 
 - New York ;   The Institute of Electrical and Electronics Engineers, Inc. ,   May 2022. 
 - Volume 37, pages 5574-5582 :  illustration ;  28 cm. 
<br/><br/> IEEE Transactions on Power Electronics, vol. 37, no. 5, pages 5574-5582, May 2022. 
<br/><br/><label>Dewey Class. No.: </label>DPer 621.317 Ie21 May 2022 v. 37 n. 5