Zhou, Wenpeng. <br/><br/>
Systematic analysis and characterization of extreme failure for IGCT in MMC-HVdc system-part II: /  failure mechanism and short circuit characteristics / 
Wenpeng Zhou, Zhanqing Yu, Zhengyu Chen, Fanglin Chen, Xueteng Tang, Zaixuan Shang, Haoyu Ma, Jun Hu, Biao Zhao, Jinpeng Wu, and Rong Zeng. 
 - New York ;  The Institute of Electrical and Electronics Engineers, Inc. ,  May 2022. 
 - Volume 37, pages 5562-5573 :  illustration ;  28 cm. 
<br/><br/> IEEE Transactions on Power Electronics, vol. 37, no. 7, pages 5562-5573, July 2022.<br/> 
<br/><br/><label>Dewey Class. No.: </label>DPer 621.317 Ie21 May 2022 v. 37 n. 5