TY  - BOOK
AU  - Vankayalapati, Bhanu Teja.
AU  - Vankayalapati, Bhanu Teja.
AU  - Pu, Shi.
AU  - Yang, Fei.
AU  - Farhadi, Masoud.
AU  - Gurusamy, Vigneshwaran.
AU  - Akin, Bilal.
TI  - Investigation and on-board detection of gate-open failure in SiC MOSFETs
U1  - DPer 621.381 In821 April 2022 v. 37 n. 4 
PY  - 2022///
CY  - New York ; 
PB  - The Institute of Electrical and Electronics Engineers, Inc.
N1  - IEEE Transaction on Power Electronics, vol. 37, no. 4, pages 4658-4671, April 2022
ER  -