Vankayalapati, Bhanu Teja. <br/><br/>
Investigation and on-board detection of gate-open failure in SiC MOSFETs / 
Bhanu Teja Vankayalapati, Shi Pu, Fei Yang, Masoud Farhadi, Vigneshwaran Gurusamy, and Bilal Akin. 
 - New York ;   The Institute of Electrical and Electronics Engineers, Inc. ,  April 2022. 
 - Volume 37, pages 4658-4671 :  illustration ;  28 cm. 
<br/><br/> IEEE Transaction on Power Electronics, vol. 37, no. 4, pages 4658-4671, April 2022. 
<br/><br/><label>Dewey Class. No.: </label>DPer 621.381 In821 April 2022 v. 37 n. 4