Short-circuit and over-current fault detection for SiC MOSFET modules based on tunnel magnetoresistance with predictive capabilities - Feng, Yuxin; Feng, Yuxin; Shao, Shuai; Du, Jiakun; Chen, Qian.; Zhang, Junming; Wu, Xinke (New York ; The Institute of Electrical and Electronics Engineers, Inc., 2022)
IEEE Transactions on Power Electronics, vol. 37, no. 4, pages 3719-3723, April 2022.