Short-circuit and over-current fault detection for SiC MOSFET modules based on tunnel magnetoresistance with predictive capabilities /
Yuxin Feng, Shuai Shao, Jiakun Du, Qian Chen, Junming Zhang, and Xinke Wu.
- New York ; The Institute of Electrical and Electronics Engineers, Inc. , April 2022.
- Volume 37, pages 3719-3723 : illustration ; 28 cm.
IEEE Transactions on Power Electronics, vol. 37, no. 4, pages 3719-3723, April 2022.