Rethinking basic assumptions for modeling parasitic capacitance in inductors / Hongbo Zhao, Shaokang Luan, Zhan Shen, Alex J. Hanson, Yuan Gao, Dipen Narendra Dalal, Rui Wang, Shuhan Zhou, and Stig Munk-Nielsen
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TextPublication details: New York ; The Institute of Electrical and Electronics Engineers, Inc. , July 2022.Description: volume 37, pages 8281-8289 : illustration ; 28 cmDDC classification: - DPer 621.317 Ie21 July 2022 v.37 n. 7
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UM Digos College - LIC | Periodicals | DPer 621.317 Ie21 July 2022 v.37 n. 7 (Browse shelf(Opens below)) | Not for loan | Periodical Article |
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IEEE Transactions on Power Electronics, vol. 37, no. 7, pages 8281-8289, July 2022.
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