Systematic analysis and characterization of extreme failure for IGCT in MMC-HVdc system-part II: / failure mechanism and short circuit characteristics / Wenpeng Zhou, Zhanqing Yu, Zhengyu Chen, Fanglin Chen, Xueteng Tang, Zaixuan Shang, Haoyu Ma, Jun Hu, Biao Zhao, Jinpeng Wu, and Rong Zeng.
Material type:
TextPublication details: New York ; The Institute of Electrical and Electronics Engineers, Inc. , May 2022.Description: Volume 37, pages 5562-5573 : illustration ; 28 cmDDC classification: - DPer 621.317 Ie21 May 2022 v. 37 n. 5
| Item type | Current library | Collection | Call number | Status | Notes | Date due | Barcode | |
|---|---|---|---|---|---|---|---|---|
Periodicals
|
UM Digos College - LIC | Periodicals | DPer 621.317 Ie21 May 2022 v. 37 n. 5 (Browse shelf(Opens below)) | Not for loan | Periodical Article |
IEEE Transactions on Power Electronics, vol. 37, no. 7, pages 5562-5573, July 2022.
There are no comments on this title.
Log in to your account to post a comment.